SIMAC – Mechanical properties of nanostructured thin films

Permanents: Eric Le Bourhis (PR UP), Pierre Godard (MdC UP), Philippe Goudeau (DR CNRS), Pierre-Olivier Renault (PR UP), Pascale Valat-Villain (MdC UP)

 

Doctorants: Thibault Chommaux (2019-2022), Yen Fred Woguem (2020-2023) 

 

One of the major objectives of this axis is to obtain a better understanding of the mechanical behavior of thin polycrystalline or monocrystalline films of a few tens of nanometer thick deposited by sputtering on polymers, and to highlight the effects of size, microstructure and architecture. The thin film - polymer composite is mechanically stressed using a very original biaxial deformation machine allowing to follow in situ by X-ray diffraction the microstructural evolutions in the film, the deformation at the crystalline level and the macroscopic deformation by digital image correlations. The experimental set-up makes it possible to measure relative changes in very low deformation (of the order of 10-5) and allow reproducing the complex deformation fields encountered by these materials in the various fields of application. The adhesion, the modes of cracking or the physical mechanisms at the origin of plasticity can be studied.

 

      • Effect of microstructure on the mechanical behavior of metallic thin films

Thanks to the deformation machine available on the DiffAbs beamline of the SOLEIL synchrotron, samples of metallic thin films with different thicknesses, grain sizes, residual stress states, crystallographic texture and architecture are studied in order to demonstrate a size effect on their mechanical behavior.

Schematic representation of the experimental setup available on the DiffAbs beamline of the SOLEIL synchrotron

Evolution of stress components σxx and σyy in thin films during biaxial tests

      • Thin Film Relaxation Study

X-ray diffraction provides the residual and applied stresses to a material, as well as the elastic strain heterogeneities (with the width of the Bragg peaks). However, DRX alone can hardly isolate a deformation mechanism. This is particularly problematic when several mechanisms are in competition, as in the case of nanocrystals. An original activity developed in the team is the study with X-ray diffraction of the mechanical relaxation of thin films. Indeed, such tests allow measuring activation volumes which are characteristic of the main plasticity mechanism, and therefore of the microstructure of the material at a given point of the test. After having demonstrated the feasibility of such mechanical tests, we simultaneously determined the evolution of the activation volumes for two texture components of a gold film 500 nm thick and showed the importance of the initial population of defects in the mechanical behavior of nanocrystalline thin films (produced by sputtering). While academic research focuses on uni-axial tests, the conditions of use of the materials in question generally lead to bi-axial stresses. We performed tensile cycles in order to highlight the importance of the mechanical annealing observed during the various stresses.

 

      • Plasticity of monocrystalline thin films

The plasticity mechanisms are anisotropic and evolve below a few tens of nanometers. In order to better understand these mechanisms involved and their relative importance, we have attempted to quantify the proportion of twinning in situ during a deformation test. This was done in 50 nm single crystal gold films which are sensitive not only to thickness. We were able to demonstrate the importance of twinning in the deformation in certain crystallographic directions, like [110] or [100].

 

These synchrotron activities were developed within the framework of an ANR Pnano Cmonano which associated Soleil and the LSPM (formerly LPMTM) of Villetaneuse for polycrystalline modeling. They come within the framework of the GDRi Mecano.

 

Last papers:

 

2020

 

Strain ratio effects in mechanical properties of supported thin films
Godard, P.; Faurie, D.; Renault, P. O., JOURNAL OF APPLIED PHYSICS 127, 10, 105103, MAR 2020

 


2019

 

X-ray diffraction and stress relaxations to study thermal and stress-assisted annealings in nanocrystalline gold thin films
Godard, P.; Faurie, D.; Sadat, T.; Drouet, M.; Thiaudiere, D.; Renault, P. O., ACTA MATERIALIA 173, pp. 87-95, DOI: 1016/j.actamat.2019.04.024, Jul 2019

 

Elastic property determination of nanostructured W/Cu multilayer films on a flexible substrate
He, W.; Han, M.; Wang, S.; Goudeau, P.; Le Bourhis, E.; Renault, P. O., ACTA MECHANICA SINICA 35, 6, pp. 1210-1216, Dec 2019

 

Study of uniaxial deformation behavior of 50 nm-thick thin film of gold single crystal using in situ X-ray pole figure measurements
La Rochelle, J. Drieu; Godard, P.; Mocuta, C.; Thiaudiere, D.; Nicolai, J.; Beaufort, M. F.; Drouet, M.; Renault, P. O., SURFACE & COATINGS TECHNOLOGY 377, UNSP, 124878, NOV 2019

 

Multiscale modeling of the elasto-plastic behavior of architectured and nanostructured Cu-Nb composite wires and comparison with neutron diffraction experiments
Gu, T.; Medy, J. -R.; Klosek, V.; Castelnau, O.; Forest, S.; Herve-Luanco, E.; Lecouturier-Dupouy, F.; Proudhon, H.; Renault, P. -O; Thilly, L.; Villechaise, P., INTERNATIONAL JOURNAL OF PLASTICITY 122, 1-30, Nov 2019

 

In situ x-ray diffraction analysis of 2D crack patterning in thin films
Faurie, D.; Zighem, F.; Godard, P.; Parry, G.; Sadat, T.; Thiaudiere, D.; Renault, P. -O., ACTA MATERIALIA 165, pp. 177-182, FEB 2019

 


2018

 

Strain transfer through film-substrate interface and surface curvature evolution during a tensile test
He, Wei; Han, Meidong; Goudeau, Philippe; Le Bourhis, Eric; Renault, Pierre-Olivier; Wang, Shibin; Li, Lin-an, APPLIED SURFACE SCIENCE 434, pp. 771-780, MAR 2018

 

Determination of Residual Stresses in an Oxidized Metallic Alloy under Thermal Loadings
Wang, Zhimao; Grosseau-Poussard, Jean-Luc; Panicaud, Benoit; Geandier, Guillaume; Renault, Pierre-Olivier; Goudeau, Philippe; Boudet, Nathalie; Blanc, Nils; Rakotovao, Felaniaina; Tao, Zhaojun, , METALS 8, 11, p.913, Nov 2018

 

Biaxial machine at Diffabs beamline for studying mechanical properties of thin films deposited onto polymer substrates
Faurie, Damien; Djaziri, Soundes; Renault, Pierre-Olivier; Le Bourhis, Eric; Goudeau, Philippe; Geandier, Guillaume; Thiaudiere, Dominique, MATERIAUX & TECHNIQUES 106, 2, 207 (erratum du vol 103, pg 610, 2015), OCT 2018

 

In situ Synchrotron X-Ray diffraction study of high-temperature stress relaxation in chromia scales containing the reactive element yttrium
Rakotovao, F.; Panicaud, B.; Grosseau-Poussard, J. L.; Tao, Z.; Geandier, G.; Renault, P. O.; Girault, P.; Goudeau, P.; Blanc, N.; Boudet, N.; Bonnet, G., , ACTA MATERIALIA 159, pp. 276-285, OCT 2018

 

Viscoplastic characteristics of thermally grown chromia films obtained from in situ 2D synchrotron X-ray diffraction
Rakotovao, F.; Panicaud, B.; Grosseau-Poussard, J. L.; Tao, Z.; Geandier, G.; Renault, P. O.; Bonnet, G.; Girault, P.; Goudeau, P.; Boudet, N.; Blanc, N., JOURNAL OF ALLOYS AND COMPOUNDS 744, pp. 591-599, MAY 5 2018

 

Plastic Deformation of Insb Micro-Pillars: A comparative Study Between Spatially Resolved Laue and Monochromatic X-Ray Micro-Diffraction Maps
Sadat, Tarik; Verezhak, Mariana; Godard, Pierre; Renault, Pierre Olivier; Van Petegem, Steven; Jacques, Vincent; Diaz, Ana; Grolimund, Daniel; Thilly, Ludovic, RESIDUAL STRESSES 2018, ECRS-10, Materials Research Proceedings 6, 21 -26, 2018

 


2017

 

Relaxation mechanisms in a gold thin film on a compliant substrate as revealed by X-ray diffraction
Godard, Pierre; Renault, Pierre-Olivier; Faurie, Damien; Thiaudiere, Dominique, APPLIED PHYSICS LETTERS , 110, 21, 211901, MAY 22 2017 2017

 

Continuous cyclic deformations of a Ni/W film studied by synchrotron X-ray diffraction
Renault, P. O.; Sadat, T.; Godard, P.; He, W.; Guerin, P. H.; Geandier, G.; Blanc, N.; Boudet, N.; Goudeau, P., SURFACE & COATINGS TECHNOLOGY 332, 351-357, DEC 2017

 

Multiscale modeling of the anisotropic electrical conductivity of architectured and nanostructured Cu-Nb composite wires and experimental comparison
Gu, T.; Medy, J. -R.; Volpi, F.; Castelnau, O.; Forest, S.; Herve-Luanco, E.; Lecouturier, F.; Proudhon, H.; Renault, P. -O.; Thilly, L., ACTA MATERIALIA 141, pp.131-141, Dec 2017

 

Frequency analysis for investigation of the thermomechanical mechanisms in thermal oxides growing on metals
Panicaud, Benoit; Grosseau-Poussard, Jean-Luc; Tao, Zhaojun; Rakotovao, Felaniaina; Geandier, Guillaume; Renault, Pierre-Olivier; Goudeau, Philippe; Boudet, Nathalie; Blanc, Nils, ACTA MECHANICA, 228 10, pp. 3595-3617, Oct 2017

 

Modelling of the Mechanical Behaviour of a Chromia Forming Alloy Under Thermal Loading
Tao, Zhaojun; Rakotovao, Felaniaina; Grosseau-Poussard, Jean-Luc; Panicaud, Benoit; Geandier, Guillaume; Renault, Pierre-Olivier; Goudeau, Philippe; Boudet, Nathalie; Blanc, Nils, OXIDATION OF METALS 88, 1SI 15-27, Aug 2017

 

Relaxation mechanisms in a gold thin film on a compliant substrate as revealed by X-ray diffraction
Godard, Pierre; Renault, Pierre-Olivier; Faurie, Damien; Thiaudiere, Dominique, APPLIED PHYSICS LETTERS, 110, 21, 211901, MAY 2017

 

Cyclic testing of thin Ni films on a pre-tensile compliant substrate
Wei, He; Renault, Pierre-Olivier; Le Bourhis, Eric; Wang, Shibin; Goudeau, Philippe, MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING 695, 112-119, MAY 2017

 

Grain Size Dependence of Elastic Moduli in Nanocrystalline Tungsten
Valat-Villain, P.; Durinck, J.; Renault, P. O., JOURNAL OF NANOMATERIALS, 3620910, 2017

 

Revealing crystalline domains in a mollusc shell single-crystalline prism
F. Mastropietro, P. Godard, M. Burghammer, C. Chevallard, J. Daillant, J. Duboisset, M. Allain, P. Guenoun, J. Nouet and V. Chamard, NATURE MATERIALS, 16, 9, 946, 2017

 


2016

 

Study on Young's modulus of thin films on Kapton by microtensile testing combined with dual DIC system
He, Wei; Goudeau, Philippe; Le Bourhis, Eric; Renault, Pierre-Olivier; Dupre, Jean Christophe; Doumalin, Pascal; Wang, Shibin, SURFACE & COATINGS TECHNOLOGY 308, 273-279, 2016

 

Nano-structuration effect on the mechanical behavior of gold thin films studied by 2D synchrotron x-ray diffraction
Guillou, R.; Le Bourhis, E.; Goudeau, P.; Renault, P. -O; Godard, P.; Faurie, D.; Geandier, G.; Mocuta, C.; Thiaudiere, D., SURFACE & COATINGS TECHNOLOGY 308, 418-423, 2016

 

ITER first mirror mock-ups exposed in Magnum-PSI
Marot, L.; De Temmerman, G.; van den Berg, M. A.; Renault, P. -O.; Covarel, G.; Joanny, M.; Travere, J. M.; Steiner, R.; Mathys, D.; Meyer, E., NUCLEAR FUSION 56, 6, 66015, Jun 2016

 


2015

 

Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography
V. Chamard, M. Allain, P. Godard, A. Talneau, G. Patriarche and M. Burghammer, SCIENTIFIC REPORTS, 5, 9827, 2015

 

Peculiar effective elastic anisotropy of nanometric multilayers studied by surface Brillouin scattering
Faurie, D.; Djemia, P.; Castelnau, O.; Brenner, R.; Belliard, L.; Le Bourhis, E.; Goudeau, Ph; Renault, P-O, SUPERLATTICES AND MICROSTRUCTURES 88, 551-560, 2015

 

Biaxial machine at Diffabs beamline for studying mechanical properties of thin films deposited onto polymer substrates
Faurie, Damien; Djaziri, Soundes; Renault, Pierre-Olivier; Le Bourhis, Eric; Goudeau, Philippe; Geandier, Guillaume; Thiaudiere, Dominique, MATERIAUX & TECHNIQUES 103, 610, 2015

 

Nondestructive three-dimensional imaging of crystal strain and rotations in an extended bonded semiconductor heterostructure
I. Pateras, M. Allain, P. Godard, L. Largeau, G. Patriarche, A. Talneau, K. Pantzas, M. Burghammer, A.A. Minkevich and V. Chamard, PHYSICAL REVIEW B, 92, 205305, 2015

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