Professor (CNU30)

Institut Pprime – UPR 3346 – CNRS, Université de Poitiers, ENSMA SP2MI

Département Physique et Mécanique des Matériaux

Bât H1 – Téléport 2 – 11, Boulevard Marie et Pierre Curie

Futuroscope-Chasseneuil- FRANCE


Mailing address :

Institut Pprime – DPMM – TSA 41123



Metallic nanoparticle arrays on rippled dielectric surfaces produced by low-energy ion erosion

  • Anisotropic optical properties in far field
  • FDTD simulations in near field
  • Functionnalized metallic nanostructures embedded in dielectrics for Surface Enhanced Raman signals (in collaboration with M. Bayle and B. Humbert, IMN, Nantes, France)
HAADF-STEM plan view image of Al2O3-capped Ag nanoparticles grown on a rippled Al2O3 thin film
Absorbance spectra of Al2O3-capped Ag nanoparticles grown on a rippled Al2O3 thin film.
SERS spectra recorded from Al2O3/Ag/Al2O3 SERS substrate with different capping-layer thickness
EF-TEM images acquired at 18.3− 19.7 eV energy losses on Si3N4-capped Al nanoparticles grown at 200 °C on a rippled Si3N4 thin film (tAl = 4.4 nm).



  • Optics and Materials
  • Colorimetry
  • Lighting (architectural, natural and combined ligthing, visual ergonomy)
  • Innovation Studies Research project


Administrative activities

Head of  the “Energy, Systems and Electrical Engineering” Department, ENSI Poitiers.

The Energy, Systems and Electrical Engineering Department offers talented engineering students expert training in 3 different programs of study leading to an Engineering Degree.  Graduates of ENSI Poitiers (School of Engineering of the University of Poitiers, France) are operational engineers in production, optimal distribution and in the rational use of classic and renewable energies in the following sectors: construction, civil engineering, transportation, manufacturing and transformation industries. The scientific curriculum and coursework are combined with guaranteed hands-on professional experience via internships in industry, lectures and conferences given by visiting professionals and on-site visits.

Selected publications

View   ORCID  and  Publons

Selection  :

  • Linear chains of Ag nanoparticles embedded in dielectric films for SERS applications in analytical chemistry, S. Camelio, D. Babonneau, E. Vandenhecke, G. Louarn, B. Humbert, Nanoscale Advances (2021)
  • Self-Assembled Dichroic Plasmonic Nitride Nanostructures with Broken Centrosymmetry for Second Harmonic Generation, D. Babonneau, S. Camelio, G. Abadias, D. Christofilos, J. J. Arvanitidis, S. Psilodimitrakopoulos, G.M. Maragkakis, E. Stratakis, N. Kalfagiannis, P. Patsalas,  ACS Applied Nano Materials (2021) DOI: 10.1021/acsanm.1c01442
  • Evolution of plasmonic nanostructures under ultra-low-energy ion bombardment, L. Simonot, F. Chabanais, S. Rousselet, F. Pailloux, S. Camelio, D. Babonneau Applied Surface Science 544 (2021) 148672. DOI: 10.1016/j.apsusc.2020.148672 
  • When Ellipsometry Works Best : A Case Study With Transparent Conductive Oxides, J. A. Hillier, S. Camelio, W. Cranton, A.V. Nabok, C. J. Mellor, D. C. Koutsogeorgis, N. Kalfagiannis ACS Photonics (2020), 7, 10, 2692–2702. DOI :10.1021/acsphotonics.0c00389
  •  Self-Assembled, 10 nm-Tailored, Near Infrared Plasmonic Metasurface Acting as Broadband Omnidirectional Polarizing Mirror, E. Soria, P. Gomez-Rodriguez, C. Tromas, S. Camelio, D.Babonneau, R. Serna, J. Gonzalo, J. Toudert, Adv. Optical Mater. (2020) 2000321.DOI : 10.1002/adom.202000321
  • Surface Plasmon Resonances and Local Field Enhancement in Aluminum Nanoparticles Embedded in Silicon Nitride, A. Fafin, S. Camelio, F. Pailloux, D. Babonneau,  The Journal of Physical Chemistry C 123, 22 (2019) 13908-13917. DOI : 10.1021/acs.jpcc.9b03050
  • Formation of nanoripples on amorphous alumina thin films during low-energy ion-beam sputtering : Experiments and simulations, D. Babonneau, E. Vandenhecke, S. Camelio Phys. Rev. B 95 (2017) 085412/1-16. DOI : 10.1103/PhysRevB.95.085412
  • Optimization of growth and ordering of Ag nanoparticle arrays on ripple patterned alumina surfaces for strong plasmonic coupling, S. Camelio, E. Vandenhecke, S. Rousselet, D. Babonneau Nanotechnology 25 (2014) 035706 (15pp). DOI : 10.1088/0957-4484/25/3/035706